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Monthly Archives: February 2022
Paper accepted: IEEE Sensors Journal
The following paper has been accepted for publication in the IEEE Sensors Journal and is now available for early access. The paper is about memory circuits using organic transistors and improving the stability and reliability of memory circuits. Zhaoxing Qin, … Continue reading
Posted in Publication
Tagged organic circuit, organic memory, robustness
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Two papers accepted for presentation in ICMTS 2022
The following two papers have been accepted for presentation at the 34th IEEE International Conference on Microelectronic Test Structures (ICMTS) 2022. Kyohei Shimozato and Takashi Sato, “dGPLVM: A nonparametric device model for statistical circuit simulation,” in Proc. IEEE International Conference … Continue reading
Posted in Conference/Workshop
Tagged Bayesian model, device model, IEEE, organic circuit
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(日本語) 3回生(研究室配属対象者)向け研究室説明会
Sorry, this entry is only available in 日本語.
Posted in Event
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Paper accepted: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
The following paper has been accepted for publication in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD). This paper is a summary of the research results developed by a former student of our laboratory, who further extended … Continue reading
Posted in Publication
Tagged device aging, IEEE, Journal, lifetime estimation, Monte Carlo simulation, reliability
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Paper accepted for presentation in IRPS2022
The following paper has been accepted for presentation in IRPS2022 (IEEE International Reliability Physics Symposium 2022). Masato Shiozaki and Takashi Sato, “Characteristic degradation of power MOSFETs by X-ray irradiation and its recovery,” in Proc. IEEE International Reliability Physics Symposium (IRPS), … Continue reading
Posted in Conference/Workshop
Tagged device modeling, power device, X-ray irradiation
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