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Daily Archives: Friday December 6th, 2019
Japanese Journal of Applied Physics: paper accepted
The following paper has been accepted for publication in Japanese Journal of Applied Physics (JJAP). This work was done in collaboration with AIST. Kunihiro Oshima, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato, “Recovery-aware bias-stress degradation model for organic … Continue reading
Posted in Publication
Tagged device model, Journal, JSAP, organic, reliability
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