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Daily Archives: Wednesday December 12th, 2018
Papers accepted for presentation in ICMTS 2019
Two papers have been accepted for presentation in ICMTS 2019 (International Conference on Microelectronic Test Structures). Michiaki Saito, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato, “A compact model of I-V characteristic degradation for organic thin film transistors,” in … Continue reading
Posted in Conference/Workshop
Tagged IEEE
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