Daily Archives: Monday December 4th, 2017

Paper Published on IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences

The following paper has been published on IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. As technology further scales semiconductor devices, aging-induced device degradation has become one of the major threats to device reliability. In addition, aging mechanisms … Continue reading

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Paper Published on IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences

The following paper has been published on IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. A circuit-aging simulation that efficiently calculates temporal change of rare circuit-failure probability is proposed. While conventional methods required a long computational time due … Continue reading

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