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Yearly Archives: 2017
(日本語) 2017年度 忘年会 & Sheldon Tan先生歓迎会
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SASIMI 2018: three student papers accepted
The following papers have been accepted for presentation in the 21st Workshop on Synthesis And System Integration of Mixed Information technologies (SASIMI2018). The workshop will be held in March 26 and 27, 2018 in Shimane. Yuki Tanaka, Song Bian, Masayuki … Continue reading
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Paper Published on IEEE Transactions on Biomedical Engineering
The following paper has been published on IEEE Transactions on Biomedical Engineering. The photoplethysmographic (PPG) signal is an important source of information for estimating heart rate (HR). However, the PPG signal could be strongly contaminated by the motion artifact of the … Continue reading
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Tagged IEEE, Journal, TBME
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Lecture talk of Dr. Chun-Wei Lin
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(日本語) 電気学会 電子デバイス・半導体電力変換合同研究会 学生奨励賞を受賞
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Student paper accepted for presentation in ISQED 2018
The following paper has been accepted for presentation in ISQED 2018 (International Symposium on Quality Electronic Design). Zuitoku Shin, Shumpei Morita, Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato: “A Study on NBTI-Induced Delay Degradation Considering Stress Frequency Dependence,” in … Continue reading
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Paper Published on IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
The following paper has been published on IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. As technology further scales semiconductor devices, aging-induced device degradation has become one of the major threats to device reliability. In addition, aging mechanisms … Continue reading
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Paper Published on IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
The following paper has been published on IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. A circuit-aging simulation that efficiently calculates temporal change of rare circuit-failure probability is proposed. While conventional methods required a long computational time due … Continue reading
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(日本語) 電気学会 半導体電力変換(SPC)研究会
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Tagged IEE, 研究会
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VMC2017
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