Monthly Archives: November 2016

ATS 2016

Mr. Bian presented his paper at Asian Test Symposium (ATS 2016) held in International Conference Center Hiroshima, Japan. Song’s talk was on the mitigation of NBTI degradation in processors. Integrated circuits suffer from the so called aging effect, represented by … Continue reading

Posted in Conference/Workshop, Publication | Tagged | Comments Off on ATS 2016

(日本語) 電気学会 電子デバイス・半導体電力変換合同研究会 学生奨励賞を受賞

Sorry, this entry is only available in 日本語.

Posted in Announcement, Award | Tagged | Comments Off on (日本語) 電気学会 電子デバイス・半導体電力変換合同研究会 学生奨励賞を受賞

(日本語) VMC 2016

Sorry, this entry is only available in 日本語.

Posted in Conference/Workshop, Publication | Tagged | Comments Off on (日本語) VMC 2016

WiPDA 2016

Dr. Shintani and Mr. Oishi presented their papers at the IEEE Workshop on Wide Bandgap Power Devices and Applications (WiPDA) held in Fayetteville, AR, USA. Dr. Shintani’s presentation was about a circuit simulation model for V-groove SiC power MOSFET with … Continue reading

Posted in Conference/Workshop, Publication | Tagged | Comments Off on WiPDA 2016

(日本語) 電気学会 電子デバイス・半導体電力変換 合同研究会

Sorry, this entry is only available in 日本語.

Posted in Conference/Workshop, Publication | Tagged , | Comments Off on (日本語) 電気学会 電子デバイス・半導体電力変換 合同研究会

Student paper accepted for presentation in DATE 2017

The following paper has been accepted for presentation in DATE 2017 (Design, Automation & Test in Europe). The acceptance rate for regular papers is 24%. Song Bian, Masayuki Hiromoto, and Takashi Sato: “Scam: Secured Content Addressable Memory Based on Homomorphic … Continue reading

Posted in Conference/Workshop, Publication | Tagged | Comments Off on Student paper accepted for presentation in DATE 2017