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Daily Archives: Thursday September 18th, 2014
Paper Published on IEEE Transactions on Device and Materials Reliability
The following article has been published on IEEE Transactions on Device and Materials Reliability. Hiromitsu Awano, Masayuki Hiromoto and Takashi Sato, “BTIarray: A Time-overlapping Transistor Array for Efficient Statistical Characterization of Bias Temperature Instability,” IEEE Transactions on Device and Materials … Continue reading
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