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一篇文章被收录于IEEE Transactions on CAD

以下文章被收录于 IEICE Transactions on Electronics. Michihiro Shintani, Takumi Uezono, Tomoyuki Takahashi, Kazumi Hatayama, Takashi Aikyo, Kazuya Masu, and Takashi Sato, “A Variability-Aware Adaptive Test Flow for Test Quality Improvement,” to appear in IEEE Transactions on Computer-Aided Design of Integrated Circuits … Continue reading

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