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Daily Archives: 11/01/13 Friday
(日本語) IEEE 論文誌 (IEEE Transactions on Electron Devices) への論文掲載
在 IEEE Transactions on Electron Devices 上刊登了论文. J.B. Velamala, K.B. Sutaria, H. Shimizu, H. Awano, T. Sato, G. Wirth, and Y. Cao, “Compact Modeling of Statistical BTI Under Trapping/Detrapping,” IEEE Transactions on Electron Devices, vol.60, no.11, pp.3645-3654, Nov. 2013. (doi: 10.1109/TED.2013.2281986) URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6612719&isnumber=6637023 … Continue reading
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