Monthly Archives: November 2013

VMC2013

Posted on Friday November 29th, 2013 by ts

On Nov. 21, Mr. Awano presented his recent work on long term reliability of VLSI circuits at VMC2013 held in San Jose. Bias temperature instability (BTI) is considered to have significant impact on long term reliability of VLSI.  At the … Continue reading →

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ASICON 2013

Posted on Monday November 4th, 2013 by ts

Prof. Sato gave a talk in ASICON 2013, which is held on Oct.28-31, 2013, in Shenzhen, China. Takashi Sato, “Statistical simulation methods for analyzing performance of low supply voltage circuits (invited),” in Proc. IEEE 10th International Conference on ASIC (ASICON), … Continue reading →

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IEEE transaction paper (TED) has been published

Posted on Friday November 1st, 2013 by ts

A paper has been just published in the November issue of IEEE Transactions on Electron Devices. J.B. Velamala, K.B. Sutaria, H. Shimizu, H. Awano, T. Sato, G. Wirth, and Y. Cao, “Compact Modeling of Statistical BTI Under Trapping/Detrapping,”  IEEE Transactions … Continue reading →

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