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ISQED 2013

Posted on 03/14/13 Thursday by admin

2013年3月4日～6日，International Symposium on Quality Electronic Design (ISQED) 2013在美国加利福尼亚州圣克拉拉市举行，本研究室今川和粟野学长做了自己的研究发表。 Takashi Imagawa, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato: “High-Speed DFG-Level SEU Vulnerability Analysis for Applying Selective TMR to Resource-Constrained CGRA,” International Symposium on Quality Electrical Design (ISQED) (Santa Clara, CA), March … Continue reading →

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