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Daily Archives: 11/12/12 Monday
VMC2012
2012年11月8日，VMC2012 (IEEE/ACM Workshop on Variability Modeling and Characterization 2012)在美国加利福尼亚州圣何塞市隆重开幕，本研究室进行了研究成果的海报发表，并于附近的计算机历史博物馆就计算机的发展史参观学习。 Michihiro Shintani and Takashi Sato, “Adaptive Current-Threshold Determination for Accurate IDDQ Testing,” IEEE/ACM Workshop on Variability Modeling and Characterization (VMC2012), November 2012.