Daily Archives: Monday November 12th, 2012


On November 8th, Prof. Sato presented the following work (poster presentation) at VMC2012 (IEEE/ACM Workshop on Variability Modeling and Characterization 2012), which was held in San Jose, CA. Michihiro Shintani and Takashi Sato, “Adaptive Current-Threshold Determination for Accurate IDDQ Testing,” … Continue reading

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