Daily Archives: 06/13/12 Wednesday

DAC 2012 (06/03-07)

2012年6月03日〜07日,在美利坚合众国加利福尼亚州旧金山市,Moscone Center 举办的DAC2012 (the 49th Design Automation Conference) 上,以下研究成果被发表。 Jyothi B. Velamala, Ketul B. Sutaria, Takashi Sato, and Yu Cao, “Physics matters: statistical aging prediction under trapping/detrapping,” ACM/IEEE Design Automation Conference (DAC), pp.139-144, June, 2012. 本次发表是与美国亚利桑那州立大学(Arizona State University)共同研究的成果,并被DAC2012选为Best paper award … Continue reading

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IEEE VTS’12 (04/23-26)

2012年4月23日〜26日,在美利坚合众国夏威夷州的Hyatt Maui举办了 IEEE VTS’12 (30th VLSI Test Symposium) ,D2 的新谷先生发表了研究成果,发表题目如下: Michihiro Shintani and Takashi Sato, “A Bayesian-based process parameter estimation using IDDQ current signature,” IEEE VLSI test symposium (VTS), pp.86-91, April, 2012.

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