ISQED2013论文采用

Posted on 11/27/12 Tuesday by admin

以下2篇论文将刊登在ISQED2013（2013年3月）

  • Hiromitsu Awano, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato, “Multi-Trap RTN Parameter Extraction Based on Bayesian Inference,” International Symposium on Quality Electrical Design (ISQED) (Santa Clara, CA), Mar. 2013 (to appear).
  • Takashi Imagawa, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato, “High-Speed DFG-Level SEU Vulnerability Analysis for Applying Selective TMR to Resource-Constrained CGRA,” International Symposium on Quality Electrical Design (ISQED) (Santa Clara, CA), Mar. 2013 (to appear).
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ASP-DAC 2013 论文采用

Posted on 11/21/12 Wednesday by admin

以下两篇论文将发表在ASP-DAC 2013（采用率97/311=31.2%）

  • Michihiro Shintani and Takashi Sato, “An Adaptive Current-Threshold Determination for IDDQ Testing Based on Bayesian Process Parameter Estimation,” ACM/IEEE Asia South Pacific Design Automation Conference (ASP-DAC) (Pacifico Yokohama, Yokohama, Japan), Jan. 2013 (to appear).
  • Tetsuro Miyakawa, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato, “Realization of Frequency-Domain Circuit Analysis Through Random Walk,” ACM/IEEE Asia South Pacific Design Automation Conference (ASP-DAC) (Pacifico Yokohama, Yokohama, Japan), Jan. 2013 (to appear).
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DATE2013 论文采用

Posted on 11/19/12 Monday by admin

以下两篇论文被DATE2013采用并将发表。根据本次论文审查的统计结果，在829篇论文中，有206篇通过了审查（审查采用率24.8%）。

  • Takashi Imagawa, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato, “A Cost-Effective Selective TMR for Heterogeneous Coarse-Grained Reconfigurable Architectures Based on DFG-Level Vulnerability Analysis,” DATE 2013 (Grenoble, France), Mar. 2013 (to appear), short presentation.
  • Zoltan Endre Rakosi, Masayuki Hiromoto, Hiroshi Tsutsui, Takashi Sato, Yukihiro Nakamura, and Hiroyuki Ochi, “Hot-Swapping Architecture with Back-Biased Testing for Mitigation of Permanent Faults in Functional Unit Array,” DATE 2013 (Grenoble, France), Mar. 2013 (to appear), long presentation.
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VMC2012

Posted on 11/12/12 Monday by ts

2012年11月8日，VMC2012 (IEEE/ACM Workshop on Variability Modeling and Characterization 2012)在美国加利福尼亚州圣何塞市隆重开幕，本研究室进行了研究成果的海报发表，并于附近的计算机历史博物馆就计算机的发展史参观学习。

  • Michihiro Shintani and Takashi Sato, “Adaptive Current-Threshold Determination for Accurate IDDQ Testing,” IEEE/ACM Workshop on Variability Modeling and Characterization (VMC2012), November 2012.
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EPEPS2012 (2012/10/22-24)

Posted on 10/27/12 Saturday by ts

2012年10月22日-24日间，EPEPS2012 (21st Conference on Electrical Performance of Electronic Packaging and Systems)在美国亚利桑那州坦佩市Tempe Mission Palms Hotel召开。本研究室就与村田制作所合作研究的成果进行了发表。

  • Koh Yamanaga and Takashi Sato, “The odd couple: antiresonance control by two capacitors of unequal series resistances,” IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems, pp. 256-259, October 2012.
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IEICE Transactions on Information and Systems论文采用

Posted on 10/24/12 Wednesday by admin

新谷同学（博士课程2年级）的以下研究成果被IEICE Transactions on Information and Systems决定采用。

  • Michihiro Shintani and Takashi Sato, “Device-Parameter Estimation
    Through IDDQ Signatures,” IEICE Transactions on Information and Systems. (to appear)
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2012年度研究室旅行（三重县篇）

Posted on 09/23/12 Sunday by admin

2012年9月2日至3日，佐藤研来到了日本三重县的鸟羽・伊势地区进行了一年一度的研究室旅行!! 期间，大家参观了著名的旅游景点：夫妇岩，鸟羽水族馆，以及伊势神宫，并为之后紧接着的芯片试作的成功完成，学业精进等进行了祈祷。作为研究室集体生活的一个重要组成部分，在本次研究室旅行中，教员与学生之间也就人生，学业，研究进展等问题进行了广泛而又深入的交流讨论。

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2012年度电气系棒球比赛

Posted on 09/18/12 Tuesday by admin

9月12日(星期三)、 本研究室在京都御所小体育场参加了2012年度电气系棒球比赛。
本次对战的选手们来自高桥研究室， 在经过2个多小时的顽强拼搏后，惜败给实力强劲的高桥研。

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获得 “DA Symposium 2011 優秀発表学生賞”

Posted on 09/03/12 Monday by admin

DA Symposium 2012发表会中，毕业生片山先生在DA Symposium 2011上的研究发表(发表题目如下)荣获 “DA Symposium 2011 優秀発表学生賞”, 并接受了颁奖。

  • Kentaro Katayama, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato, “Sequential Importance Sampling for Yield Estimation of Circuits with Multiple Failure Regions,” in Proc. of IPSJ DA Symposium 2011, Aug. 2011 (in Japanese).
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DA Symposium 2012

Posted on 08/31/12 Friday by admin

2012年8月29日〜30日在ホテル下呂温泉水明館举办的DA Symposium 2012上，研究生清水同学发表了自己的研究成果（发表题目如下）。

  • Hirofumi Shimizu, Hiromitsu Awano, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato, “Estimation of Model Parameters for Random Telegraph Noise Based on Information Criterion,” in Proc. of IPSJ DA Symposium 2012, Aug. 2012 (in Japanese).
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