Tag Archives: IEEE

(日本語) IEEEマイルストン贈呈式プレイベント

Posted on Saturday May 16th, 2015 by hiromoto

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(日本語) 第11回IEEE関西支部学生研究奨励賞 受賞

Posted on Friday February 13th, 2015 by admin

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Paper Published on IEEE Transactions on Device and Materials Reliability

Posted on Thursday September 18th, 2014 by admin

The following article has been published on IEEE Transactions on Device and Materials Reliability. Hiromitsu Awano, Masayuki Hiromoto and Takashi Sato, “BTIarray: A Time-overlapping Transistor Array for Efficient Statistical Characterization of Bias Temperature Instability,” IEEE Transactions on Device and Materials … Continue reading →

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(日本語) ICCAD2014 採択決定

Posted on Friday June 6th, 2014 by hiromoto

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A paper has been accepted for publication in IEEE Transactions on Device and Materials Reliability

Posted on Wednesday May 21st, 2014 by admin

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A paper has been accepted for publication in IEEE Transactions on Device and Materials Reliability

Posted on Monday March 3rd, 2014 by ts

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Our paper has been accepted for publication in IEEE Trans. on CAD

Posted on Tuesday January 21st, 2014 by ts

The following paper has been accepted for publication in IEICE Transactions on Electronics. Michihiro Shintani, Takumi Uezono, Tomoyuki Takahashi, Kazumi Hatayama, Takashi Aikyo, Kazuya Masu, and Takashi Sato, “A Variability-Aware Adaptive Test Flow for Test Quality Improvement,” to appear in … Continue reading →

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VMC2013

Posted on Friday November 29th, 2013 by ts

On Nov. 21, Mr. Awano presented his recent work on long term reliability of VLSI circuits at VMC2013 held in San Jose. Bias temperature instability (BTI) is considered to have significant impact on long term reliability of VLSI.  At the … Continue reading →

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ASICON 2013

Posted on Monday November 4th, 2013 by ts

Prof. Sato gave a talk in ASICON 2013, which is held on Oct.28-31, 2013, in Shenzhen, China. Takashi Sato, “Statistical simulation methods for analyzing performance of low supply voltage circuits (invited),” in Proc. IEEE 10th International Conference on ASIC (ASICON), … Continue reading →

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IEEE transaction paper (TED) has been published

Posted on Friday November 1st, 2013 by ts

A paper has been just published in the November issue of IEEE Transactions on Electron Devices. J.B. Velamala, K.B. Sutaria, H. Shimizu, H. Awano, T. Sato, G. Wirth, and Y. Cao, “Compact Modeling of Statistical BTI Under Trapping/Detrapping,”  IEEE Transactions … Continue reading →

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