Processor Architecture and Systems Synthesis Laboratory

Qin, M2, presented his research in IEEE International Conference on Flexible and Printable Sensors and Systems (FLEPS) 2019 held in Glasgow, UK on July 7-9, 2019 (Presentation date: 9th).

Qin’s presentation is on the design of organic transistor-based PUF circuits, which exploit the variability in device manufacturing to achieve authentication. The goal is to create a hard-to-replicate tag that can authenticate various products by leveraging the advantages of organic transistors that can be fabricated on flexible substrates at low cost. In this presentation, we proposed a current mirror array PUF circuit that can compensate for the degradation of organic devices. The circuit can self-compensate for transistor degradation over time by sharing the gate voltage of the current mirror. Through measurements of the proposed circuit over a period of one month, we evaluated randomness, diffusivity, and reproducibility, which are key metrics for evaluating PUFs, and confirmed that the proposed circuit is highly tolerant of response changes due to device degradation.

• Zhaoxing Qin, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato, “OCM-PUF: Organic current mirror PUF with enhanced resilience to device degradation,” in Proc. IEEE International Conference on Flexible and Printable Sensors and Systems (FLEPS), P-47 , July 2019.