DATE2015

Posted on Tuesday March 17th, 2015 by admin

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(日本語) 2015年3月VLD研究会

Posted on Friday March 6th, 2015 by hiromoto

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(日本語) 3回生(研究室配属対象者)向け研究室見学会開催

Posted on Wednesday February 25th, 2015 by hiromoto

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(日本語) 第11回IEEE関西支部学生研究奨励賞 受賞

Posted on Friday February 13th, 2015 by admin

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(日本語) 2015年1月EMCJ研究会

Posted on Tuesday February 3rd, 2015 by admin

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(日本語) 2014年度 忘年会

Posted on Thursday December 25th, 2014 by admin

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(日本語) デザインガイア2014

Posted on Monday December 1st, 2014 by admin

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ICCAD 2014

Posted on Monday November 17th, 2014 by hiromoto

During the International Conference on Computer-Aided Design (ICCAD) 2014 held in San Jose, California on November 2~6, 2014, Dr. Shintani made a presentation on his research (The presentation was on Nov. 4. Acceptance rate is 77/304=25%).

ICCAD is the leading conference in the field of CAD (Computer-aided design) for integrated circuits. This year marks the 33rd session convened for this time-honored international conference. During the conference, the state-of-art CAD researches were thoroughly presented and discussed, envisioning also in the fields of embedded IC for cars and IC security. This conference was hold annually in San Jose, the center of Silicon Valley. Around the site where the conference was held stand the head quarters of many high-tech companies including Apple Inc. It is one of the largest home for the IT business.

  • Michihiro Shintani and Takashi Sato:
    “Sensorless Estimation of Global Device-Parameters Based on Fmax Testing,” in Proc. of ACM/IEEE International Conference on Computer-Aided Design (ICCAD), pp.498-503, Nov. 2014.
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(日本語) DATE2015採択決定

Posted on Thursday November 6th, 2014 by admin

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ICSICT2014

Posted on Tuesday November 4th, 2014 by hiromoto

The IEEE 12th International Conference on Solid-State and Integrated Technology (ITSICT2014) was held in Guilin, Guangxi, China on October 27~31, 2014. Professor Sato made his invited talk on the long-term reliability of semiconductor circuits (The talk was on Oct. 28).

A significant number of presentations were delivered during the conference, reflecting the active nature of Chinese scholars in fields related to microdevices.

  • Takashi Sato, Hiromitsu Awano, and Masayuki Hiromoto:
    “A Scalable Device Array for Statistical Device-Aging Characterization (invited),” in Proc. of 2014 IEEE 12th International Conference on Solid-State and Integrated Circuit Technology (ICSICT-2014) (Guilin, China), pp.255-258, Oct. 2014.
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