Processor Architecture and Systems Synthesis Laboratory

Dr. Shintani presented his paper at IEEE Applied Power Electronics Conference and Exposition (APEC) 2017 held in Tampa, FL, USA.

Dr. Shintani’s presentation was a pioneer work on the security of power devices. APEC is the leading conference in the field of power electronics. During the conference, more than 3,000 researchers and developers attended and thoroughly discussed. Moreover, more than 100 power electronics companies exhibited in the exposition that was held in conjunction with APEC. We were highly inspired by the contact with the technologies and product of the state-of-art power electronics.

• Michihiro Shintani, Kazuki Oishi, Rui Zhou, Masayuki Hiromoto, and Takashi Sato:
  “Device Identification from Mixture of Measurable Characteristics,” in Proc. of the 32nd Annual IEEE Applied Power Electronics Conference & Exposition (APEC), Mar. 2017.

Mr. Oishi presented his paper at International Conference on Microelectronic Test Structures (ICMTS) 2017 held in Grenoble, France.

Mr. Oishi’s talk was about input capacitance measurement of power MOSFETs. The modeling of the input capacitance is crucial for the simulation of power converters. However, conventional methods could not measure the capacitance accurately when the channel of MOSFET is formed. In this paper, we propose a novel method for determining the input capacitance using switching waveforms. The proposed method enables the capacitance measurement even when the channel is formed. The experimental results show that the capacitance model obtained by the proposed method simulates switching waveforms accurately and reduces timing errors by more than 16 times when compared to the conventional model.

• Kazuki Oishi, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato:
  “Input Capacitance Determination of Power MOSFETs from Switching Trajectories,” in Proc. of International Conference on Microelectronic Test Structures (ICMTS), pp.87-92, Mar. 2017.