A paper accepted for publication in IEICE journal

The following paper has been accepted for publication in IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences.

  • Satoshi Yamamori, Masayuki Hiromoto, and Takashi Sato:
    “Efficient Mini-Batch Training on Memristor Neural Network Integrating Gradient Calculation and Weight Update,” IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, (to appear).
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IMW2018: student paper accepted

The following paper has been accepted for presentation in the IEEE International Memory Workshop (IMW) 2018. The conference will be held in May 14-16, 2018 in Kyoto.

  • Shogo Matsumoto, Hidenori Gyoten, Masayuki Hiromoto, and Takashi Sato:
    “RRAM/CMOS-Hybrid Architecture of Annealing Processor for Fully Connected Ising Model,” in Proc. of International Memory Workshop (IMW) (Kyoto, Japan), May 2018 (to appear).
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(日本語) 第31回 回路とシステムワークショップ 採択決定

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Paper Published on Japanese Journal of Applied Physics (JJAP)

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A paper accepted for publication in IEICE journal

The following paper has been accepted for publication in IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences.

  • Masayuki Hiromoto, Motoki Yoshinaga, and Takashi Sato:
    “MRO-PUF: Physically Unclonable Function with Enhanced Resistance against Machine Learning Attacks Utilizing Instantaneous Output of Ring Oscillator,” IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, July 2018 (to appear).
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(日本語) 3回生(研究室配属対象者)向け研究室見学会開催

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Paper Published on IEICE Transactions on Information and Systems

The following paper has been published on IEICE Transactions on Information and Systems.

An area-efficient FPGA-based annealing processor that is based on Ising model is proposed. The proposed processor eliminates random number generators (RNGs) and temperature schedulers, which are the key components in the conventional annealing processors and occupying a large portion of the design. Instead, a shift-register-based spin flipping scheme successfully helps the Ising model from stucking in the local optimum solutions. An FPGA implementation and software-based evaluation on max-cut problems of 2D-grid torus structure demonstrate that our annealing processor solves the problems 10-10000 times faster than conventional optimization algorithms to obtain the solution of equal accuracy.

  • Hidenori Gyoten, Masayuki Hiromoto, and Takashi Sato:
    “Area Efficient Annealing Processor for Ising Model without Random Number Generator,” IEICE Transactions on Information and Syst​_em​_s, Vol.E101-D, No.2, pp.314-323, Feb. 2018.
    DOI: 10.1587/transinf.2017RCP0015
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(日本語) DAC2018採択決定

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Paper accepted for publication in IEEE Transactions on Power Electronics

The following paper has been accepted for publication in IEEE Transactions on Power Electronics (TPEL).

  • Michihiro Shintani, Yohei Nakamura, Kazuki Oishi, Masayuki Hiromoto, Takashi Hikihara, and Takashi Sato:
    “Surface-Potential-Based Silicon Carbide Power MOSFET Model for Circuit Simulation,” IEEE Transactions on Power Electronics, (to appear).
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ACM/IEEE ASP-DAC 2018

Mr.  Shumpei Morita presented his paper in the 23rd Asia and South Pacific Design Automation Conference (ASP-DAC 2018) held in Jeju Island, Korea.

Morita’s talk was about the analysis of the circuit degradation. The effect of negative bias temperature instability (NBTI) varies significantly according to given workloads, and thus path delay degradation is strongly dependent on each use case. In this paper, we propose a subset simulation (SS) framework that efficiently and accurately finds the worst case workload and the failure probability covering various workloads. In the proposed method, workloads that yield worst aged delay are efficiently generated by the NBTI-aware Markov chain Monte Carlo method. Through numerical experiments using benchmark circuits, the proposed method achieves up to 36 times speedup compared to the naive Monte Carlo method. From the result of the SS, feasible workload that gives worst aged delay is obtained.

  • Shumpei Morita, Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato:
    “Efficient Exploration of Worst Case Workload and Timing Degradation under NBTI,” Proc. of Asia and South Pacific Design Automation Conference (ASP-DAC) (Jeju Island, Korea), pp.631-636, Jan. 2018.
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