Tag Archives: IEEE

DATE 2013

Posted on Monday March 25th, 2013 by admin

On March 20th, Mr. Imagawa and Mr. Rákossy presented their recent works at Design, Automation & Test in Europe (DATE) 2013, which was held in Grenoble, France. Zoltán Endre Rákossy, Masayuki Hiromoto, Hiroshi Tsutsui, Takashi Sato, Yukihiro Nakamura, and Hiroyuki … Continue reading →

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Paper accepted for GLSVLSI2013

Posted on Monday February 18th, 2013 by ts

The following paper is accepted for presentation at GLSVLSI2013, which will be held on May 2-4 in Paris, France. Takumi Morishita, Hiroshi Tsutsui, Hiroyuki Ochi and Takashi Sato, ”Fast and Memory-Efficient GPU Implementations of Krylov Subspace Methods for Efficient Power … Continue reading →

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IEEE Kansai Section Student Paper Awards

Posted on Wednesday February 13th, 2013 by admin

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ACM/IEEE ASPDAC 2013

Posted on Sunday January 27th, 2013 by ts

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2012 IEEE Student Branch Leadership Training Workshop in Japan Council at Meiji University

Posted on Thursday December 20th, 2012 by admin

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ISQED2013 papers accepted

Posted on Tuesday November 27th, 2012 by admin

The following two papers are accepted for presentation at ISQED2013, which will be held at Santa Clara in March 2013. Hiromitsu Awano, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato, “Multi-Trap RTN Parameter Extraction Based on Bayesian Inference,” International Symposium on Quality … Continue reading →

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ASP-DAC 2013 papers accepted

Posted on Wednesday November 21st, 2012 by admin

The following two papers will appear in proceedings of ASP-DAC 2013. Michihiro Shintani and Takashi Sato, “An Adaptive Current-Threshold Determination for IDDQ Testing Based on Bayesian Process Parameter Estimation,” ACM/IEEE Asia South Pacific Design Automation Conference (ASP-DAC) (Pacifico Yokohama, Yokohama, Japan), … Continue reading →

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DATE2013 papers accepted

Posted on Monday November 19th, 2012 by admin

The following two papers are accepted for presentation at DATE2013. According to the acceptance notification, only 206 papers out of 829 reviewed submissions were selected for either “long” or “short” presentation at the conference, which means the acceptance ratio is … Continue reading →

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VMC2012

Posted on Monday November 12th, 2012 by ts

On November 8th, Prof. Sato presented the following work (poster presentation) at VMC2012 (IEEE/ACM Workshop on Variability Modeling and Characterization 2012), which was held in San Jose, CA. Michihiro Shintani and Takashi Sato, “Adaptive Current-Threshold Determination for Accurate IDDQ Testing,” … Continue reading →

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EPEPS2012 (2012/10/22-24)

Posted on Saturday October 27th, 2012 by ts

We presented the following work at EPEPS2012 (21st Conference on Electrical Performance of Electronic Packaging and Systems), which was held in Tempe Mission Palms Hotel, Tempe, AZ, from Oct. 22 to 24. This work is a collaborative research with Murata … Continue reading →

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