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May 2025 M T W T F S S « Apr 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 Archives
Category Archives: Conference/Workshop
The 32nd circuits and systems workshop @ TDU
Posted in Conference/Workshop
Tagged KWS, sensing
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FLEPS2019
Qin, M2, presented his research in IEEE International Conference on Flexible and Printable Sensors and Systems (FLEPS) 2019 held in Glasgow, UK on July 7-9, 2019 (Presentation date: 9th). Qin’s presentation is on the design of organic transistor-based PUF circuits, … Continue reading
A paper accepted for ICSCRM2019 in Kyoto
The following paper has been accepted as an oral presentation in International Conference on Silicon Carbide and Related Materials (ICSCRM) 2019. Michihiro Shintani, Kazuki Oishi, and Takashi Sato, “A three-level active gate drive circuit for power MOSFETs utilizing a generic … Continue reading
Posted in Conference/Workshop, Publication
Tagged power electronics
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SSDM 2019: paper accepted
The following paper has been accepted as an oral presentation in International Conference on Solid State Devices and Materials (SSDM) 2019. Kunihiro Oshima, Michiaki Saito, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato, “Experimental study of bias stress degradation … Continue reading
Posted in Conference/Workshop
Tagged device model, JSAP, organic, reliability, SSDM
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(日本語) 2019年5月VLD研究会
Posted in Conference/Workshop, Publication
Tagged IEICE, Ising, VLD
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A paper accepted for poster presentation in FLEPS2019, Grasgow
A paper entitled “OCM-PUF: an organic current mirror PUF with enhanced resilience to device degradation”, has been accepted for poster presentation at the 2019 IEEE International Conference on Flexible & Printable Sensors & Systems, to be held in Glasgow, Scotland … Continue reading
Posted in Conference/Workshop
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DATE2019
Posted in Conference/Workshop, Publication
Tagged ACM, DATE, IEEE, security
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ICMTS2019
Two students, Tsukamoto and Saito, presented papers in the 32nd IEEE International Conference on Microelectronic Test Structure (ICMTS) 2019, at the International conference center in Kitakyushu, which was held during March 18-21, 2019. Hiroki Tsukamoto, Michihiro Shintani, and Takashi Sato, … Continue reading
Posted in Conference/Workshop
Tagged device model, ICMTS, IEEE, organic, power electronics, reliability
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