Category Archives: Conference/Workshop

Mr. Bian presented his paper at Asian Test Symposium (ATS 2016) held in International Conference Center Hiroshima, Japan. Song’s talk was on the mitigation of NBTI degradation in processors. Integrated circuits suffer from the so called aging effect, represented by … Continue reading →

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Dr. Shintani and Mr. Oishi presented their papers at the IEEE Workshop on Wide Bandgap Power Devices and Applications (WiPDA) held in Fayetteville, AR, USA. Dr. Shintani’s presentation was about a circuit simulation model for V-groove SiC power MOSFET with … Continue reading →

The following papers have been accepted for presentation in VMC2016 (IEEE/ACM Workshop on Variability Modeling and Characterization). Michihiro Shintani, Kazuki Oishi, Rui Zhou, Masayuki Hiromoto, and Takashi Sato: “Unique Device Identification Framework for Power MOSFETs Using Inherent Device Variation,” in Proc. … Continue reading →

The following paper has been accepted for presentation in APEC2017 (the 32nd Annual IEEE Applied Power Electronics Conference & Exposition). Michihiro Shintani, Kazuki Oishi, Rui Zhou, Masayuki Hiromoto, and Takashi Sato: “Device Identification from Mixture of Measurable Characteristics,” in Proc. … Continue reading →