Category Archives: Conference/Workshop

(日本語) DAシンポジウム2017

Posted on Friday September 1st, 2017 by hiromoto

Sorry, this entry is only available in 日本語.

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(日本語) 電気学会 半導体電力変換研究会

Posted on Wednesday August 2nd, 2017 by hiromoto

Sorry, this entry is only available in 日本語.

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SSDM 2017: paper accepted

Posted on Friday July 14th, 2017 by hiromoto

The following paper has been accepted for oral presentation in International Conference on Solid State Devices and Materials (SSDM), which will be held during September 19-22, 2017. Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, Masayuki Hiromoto, and Takashi Sato: “A Design-Analysis … Continue reading →

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A paper presented at DAC2017

Posted on Wednesday June 28th, 2017 by hiromoto

Mr. Song Bian presented his paper in Design Automation Conference (DAC) 2017 held in Austin, Tx. Song’s presentation was on creating learning-based STA libraries for characterizing aging-induced device variations. Traditional approach to the accurate characterization of aging (specifically negative bias … Continue reading →

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(日本語) 電気学会 半導体電力変換研究会

Posted on Wednesday June 14th, 2017 by hiromoto

Sorry, this entry is only available in 日本語.

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(日本語) 第29回 回路とシステムワークショップ 奨励賞 受賞

Posted on Wednesday May 17th, 2017 by hiromoto

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(日本語) 第30回 回路とシステムワークショップ＠北九州国際会議場

Posted on Wednesday May 17th, 2017 by hiromoto

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DATE 2017

Posted on Tuesday April 4th, 2017 by hiromoto

Mr. Song Bian presented his paper at Design, Automation and Test  in Europe (DATE) 2017 held in Lausanne, Switzerland. The acceptance rate of oral presentation is 24%. Song’s talk was on the realization of a secured content addressable memory (CAM) … Continue reading →

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APEC 2017

Posted on Tuesday April 4th, 2017 by hiromoto

Dr. Shintani presented his paper at IEEE Applied Power Electronics Conference and Exposition (APEC) 2017 held in Tampa, FL, USA. Dr. Shintani’s presentation was a pioneer work on the security of power devices. APEC is the leading conference in the … Continue reading →

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ICMTS 2017

Posted on Tuesday April 4th, 2017 by ts

Mr. Oishi presented his paper at International Conference on Microelectronic Test Structures (ICMTS) 2017 held in Grenoble, France. Mr. Oishi’s talk was about input capacitance measurement of power MOSFETs. The modeling of the input capacitance is crucial for the simulation … Continue reading →

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