Category Archives: Publication

(日本語) IEEE 論文誌 (IEEE Transactions on Device and Materials Reliability)への論文掲載

Posted on 09/18/14 Thursday by admin

对不起，此内容只适用于English和日本語。

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(日本語) 英文論文誌 IEICE Transactions on Information and Systemsへの論文掲載

Posted on 08/12/14 Tuesday by ts

对不起，此内容只适用于English和日本語。

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(日本語) IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciencesへの論文採録決定

Posted on 08/11/14 Monday by hiromoto

对不起，此内容只适用于日本語。

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(日本語) 情報処理学会 SLDM研究会

Posted on 06/02/14 Monday by hiromoto

对不起，此内容只适用于日本語。

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(日本語) IEEE Transactions on Device and Materials Reliabilityへの論文採録決定

Posted on 05/21/14 Wednesday by admin

对不起，此内容只适用于日本語。

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(日本語) IEICE Transactions on Information and Systemsへの論文採録決定

Posted on 04/28/14 Monday by ts

对不起，此内容只适用于日本語。

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(日本語) IEICE Transactions on Electronics への論文掲載

Posted on 04/22/14 Tuesday by ts

对不起，此内容只适用于日本語。

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(日本語) IEEE Transactions on Device and Materials Reliabilityへの論文採録決定

Posted on 03/03/14 Monday by ts

对不起，此内容只适用于日本語。

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一篇文章被收录于IEEE Transactions on CAD

Posted on 01/21/14 Tuesday by ts

以下文章被收录于 IEICE Transactions on Electronics. Michihiro Shintani, Takumi Uezono, Tomoyuki Takahashi, Kazumi Hatayama, Takashi Aikyo, Kazuya Masu, and Takashi Sato, “A Variability-Aware Adaptive Test Flow for Test Quality Improvement,” to appear in IEEE Transactions on Computer-Aided Design of Integrated Circuits … Continue reading →

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一篇文章被收录于 IEICE Transactions

Posted on 01/06/14 Monday by ts

以下文章被收录于IEICE Transactions on Electronics. Shiho Hagiwara, Takanori Date, Kazuya Masu, and Takashi Sato, “Hypersphere Sampling for Accelerating High-Dimension and Low-Failure Probability Circuit-Yield Analysis,” to appear in IEICE Transactions on Electronics.

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