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May 2025 M T W T F S S « Apr 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 Archives
Category Archives: Publication
DATE 2017
Mr. Song Bian presented his paper at Design, Automation and Test in Europe (DATE) 2017 held in Lausanne, Switzerland. The acceptance rate of oral presentation is 24%. Song’s talk was on the realization of a secured content addressable memory (CAM) … Continue reading
APEC 2017
Dr. Shintani presented his paper at IEEE Applied Power Electronics Conference and Exposition (APEC) 2017 held in Tampa, FL, USA. Dr. Shintani’s presentation was a pioneer work on the security of power devices. APEC is the leading conference in the … Continue reading
ICMTS 2017
Mr. Oishi presented his paper at International Conference on Microelectronic Test Structures (ICMTS) 2017 held in Grenoble, France. Mr. Oishi’s talk was about input capacitance measurement of power MOSFETs. The modeling of the input capacitance is crucial for the simulation … Continue reading
(日本語) 2017年 電子情報通信学会 総合大会
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ISQED 2017
Mr. Morita presented his paper at International Symposium on Quality Electronic Design (ISQED) 2017 held in Santa Clara, CA. Mr. Morita’s talk was about the mitigation of the circuit degradation. Replacement of highly stressed logic gates with internal node control … Continue reading
(日本語) 第30回 回路とシステムワークショップ 採択決定
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Posted in Conference/Workshop, Publication
Tagged IEICE, KWS
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(日本語) 2017年3月SIS研究会
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Tagged IEICE, SIS, 研究会
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Student paper accepted for publication in IEICE journal
Following paper written by M1 student has been accepted for publication in IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. Shumpei Morita, Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato: “Utilization of Path-Clustering in Efficient Stress-Control Gate … Continue reading
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Tagged IEICE, Journal
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Student paper accepted for presentation in DAC 2017
The following paper has been accepted for presentation in DAC 2017 (ACM/IEEE Design Automation Conference). Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato: “LSTA: Learning-Based Static Timing Analysis for High-Dimensional Correlated On-Chip Variations,” in Proc. of ACM/IEEE Design Automation … Continue reading
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Tagged ACM, DAC, IEEE
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ACM/IEEE ASPDAC 2017
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Tagged ACM, ASP-DAC, IEEE
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