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May 2025 M T W T F S S « Apr 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 Archives
Category Archives: Publication
Paper accepted for publication in IEEE Transactions on Very Large Scale Integration Systems
The following paper has been accepted for publication in IEEE Transactions on Very Large Scale Integration Systems (TVLSI). Hiromitsu Awano, Shumpei Morita, and Takashi Sato: “Scalable device array for statistical characterization of BTI-related parameters,” IEEE Transactions on Very Large Scale … Continue reading
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(日本語) 第42回パルテノン研究会
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Paper accepted for publication in Japanese Journal of Applied Physics
The following paper has been accepted for publication in Japanese Journal of Applied Physics (JJAP). Michihiro Shintani, Yohei Nakamura, Masayuki Hiromoto, Takashi Hikihara, and Takashi Sato: “Measurement and Modeling on Gate-Drain Capacitance of Silicon Carbide Vertical MOSFET,” Japanese Journal of … Continue reading
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Student paper accepted for presentation in ISQED 2017
The following paper has been accepted for presentation in ISQED 2017 (International Symposium on Quality Electronic Design). Shumpei Morita, Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato: “Comparative Study of Path Selection and Objective Function in Replacing NBTI Mitigation Logic,” … Continue reading
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Student paper accepted for presentation in ICMTS 2017
The following paper has been accepted for presentation in ICMTS 2017 (International Conference on Microelectronic Test Structures). Kazuki Oishi, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato: “Input Capacitance Determination of Power MOSFETs from Switching Trajectories,” in Proc. of International Conference … Continue reading
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NOLTA 2016
Dr. Shintani and Mr. Zhou presented their papers at International Symposium on Nonlinear Theory and Its Applications (NOLTA 2016) held in Yugawara, Japan. Dr. Shintani’s talk was on the gate driver without its switching loss. As switching frequency increases, the … Continue reading
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ATS 2016
Mr. Bian presented his paper at Asian Test Symposium (ATS 2016) held in International Conference Center Hiroshima, Japan. Song’s talk was on the mitigation of NBTI degradation in processors. Integrated circuits suffer from the so called aging effect, represented by … Continue reading
(日本語) VMC 2016
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WiPDA 2016
Dr. Shintani and Mr. Oishi presented their papers at the IEEE Workshop on Wide Bandgap Power Devices and Applications (WiPDA) held in Fayetteville, AR, USA. Dr. Shintani’s presentation was about a circuit simulation model for V-groove SiC power MOSFET with … Continue reading
(日本語) 電気学会 電子デバイス・半導体電力変換 合同研究会
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Tagged IEE, 研究会
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