Author Archives: ts

(日本語) IEEE 論文誌 (IEEE Transactions on Electron Devices) への論文掲載

在 IEEE Transactions on Electron Devices 上刊登了论文. J.B. Velamala, K.B. Sutaria, H. Shimizu, H. Awano, T. Sato, G. Wirth, and Y. Cao, “Compact Modeling of Statistical BTI Under Trapping/Detrapping,”  IEEE Transactions on Electron Devices, vol.60, no.11, pp.3645-3654, Nov. 2013. (doi: 10.1109/TED.2013.2281986) URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6612719&isnumber=6637023 … Continue reading

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(日本語) IEICE Transactions on Electronics への採録決定

以下论文被 IEICE Transactions on Electronics 采用了. Koh Yamanaga, Shiho Hagiwara, Ryo Takahashi, Kazuya Masu, and Takashi Sato, “State-Dependence of On-Chip Power Distribution Network Capacitance: Measurement and Analysis, to appear in IEICE Transactions on Electronics, Vol.E97-C, No.1, Jan. 2014.

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IEICE 論文誌への論文掲載

电子情报通信学会的英文论文集 IEICE Transactions on Electronics, IEICE Transactions on Information and Systems 中,被采用的论文为以下几篇: Hiroshi Yuasa, Hiroshi Tsutsui, Hiroyuki Ochi and Takashi Sato, “Parallel acceleration scheme for Monte Carlo based SSTA using generalized STA processing element,” IEICE Transactions on Electronics, Vol.E96-C, No.4, … Continue reading

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GLSVLSI2013论文采用

森下同学(M2)的论文被GLSVLSI2013 (5月)采用。论文题目为: Takumi Morishita, Hiroshi Tsutsui, Hiroyuki Ochi and Takashi Sato, “Fast and Memory-Efficient GPU Implementations of Krylov Subspace Methods for Efficient Power Grid Analysis,” Proc. of GLSVLSI (Paris, France), May. 2013 (to appear).

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ACM/IEEE ASPDAC 2013

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本研究室博士生新谷先生与佐藤教授于ASPDAC2013做了研究发表。 新谷先生的研究成果大大提高了隐含在VLSI设计中存在的技术故障的检出精度。宫川先生 (2012年3月毕业生) 的研究成果则是实现了通过随机游走 (Random Walk) 技术对VLSI的电源设计品质进行高速验证。特别是对于频域分析领域的研究,本研究成果则是确立了世界领先的地位。以上的研究成果与技术,对我们日常使用的电子产品的安全性和信赖性的提高做出了巨大的贡献!

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VMC2012

2012年11月8日,VMC2012 (IEEE/ACM Workshop on Variability Modeling and Characterization 2012)在美国加利福尼亚州圣何塞市隆重开幕,本研究室进行了研究成果的海报发表,并于附近的计算机历史博物馆就计算机的发展史参观学习。 Michihiro Shintani and Takashi Sato, “Adaptive Current-Threshold Determination for Accurate IDDQ Testing,” IEEE/ACM Workshop on Variability Modeling and Characterization (VMC2012), November 2012.

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EPEPS2012 (2012/10/22-24)

2012年10月22日-24日间,EPEPS2012 (21st Conference on Electrical Performance of Electronic Packaging and Systems)在美国亚利桑那州坦佩市Tempe Mission Palms Hotel召开。本研究室就与村田制作所合作研究的成果进行了发表。 Koh Yamanaga and Takashi Sato, “The odd couple: antiresonance control by two capacitors of unequal series resistances,” IEEE 21st Conference on Electrical Performance of Electronic Packaging … Continue reading

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