Author Archives: ts

Student paper presented at GLSVLSI 2016

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(日本語) SASIMI2015

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Paper Published on IEICE Transactions on Information an Systems

The following paper has been published on IEICE Transactions on Information and Systems. IDDQ test is a way of measuring manufacturing faults in chips by measuring the leakage current while the chip is in its quiescent state (i.e., when all … Continue reading

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Won a best paper award in ITC-CSCC

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A paper has been accepted for publication in IEICE Transactions

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(日本語) IEICE Transactions on Electronics への論文掲載

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Visiting RWTH-Aachen

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Asia Informatics Seminar 2014

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ISQED2014

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A paper has been accepted for publication in EMC’14/Tokyo

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