Author Archives: hiromoto

The following paper has been accepted for presentation in ISQED 2016. Song Bian, Michihiro Shintani, Shumpei Morita, Masayuki Hiromoto, and Takashi Sato: “Nonlinear Delay-Table Approach for Full-Chip NBTI Degradation Prediction,” in Proc. of International Symposium on Quality Electronic Design (ISQED) … Continue reading →

The following papers are accepted for publication in TAU workshop 2016, congratulations! Hiromitsu Awano and Takashi Sato: “Efficient Transistor-Level Timing Yield Estimation via Line Sampling,” in Proc. of ACM/IEEE International Workshop on Timing Issues (TAU) (Santa Rosa, CA), Mar. 2016 … Continue reading →

The paper below has been accepted for ISCAS2016, which will be held in May 2016 at Montreal, Canada. Motoki Yoshinaga, Hiromitsu Awano, Masayuki Hiromoto, and Takashi Sato: “Physically Unclonable Function using RTN-Induced Delay Fluctuation in Ring Oscillators,” IEEE International Symposium … Continue reading →