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- Japanese Journal of Applied Physicsへの論文採録決定Paper accepted for publication in Japanese Journal of Applied PhysicsPaper accepted for publication in Japanese Journal of Applied Physics
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Tag Archives: VMC
VMC2017
Sorry, this entry is only available in 日本語.
VMC2013
On Nov. 21, Mr. Awano presented his recent work on long term reliability of VLSI circuits at VMC2013 held in San Jose. Bias temperature instability (BTI) is considered to have significant impact on long term reliability of VLSI. At the … Continue reading