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- IEEE関西支部学生研究奨励賞 受賞IEEE Kansai section student paper award
- ISCAS2021採択決定ISCAS2021: paper acceptedISCAS2021: paper accepted
- IEEE CEDA All Japan Joint Chapter Academic Research Award受賞Oshima received the IEEE CEDA All Japan Joint Chapter Academic Research AwardOshima received the IEEE CEDA All Japan Joint Chapter Academic Research Award
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Tag Archives: SSDM
SSDM2020
Posted in Conference/Workshop
Tagged JSAP, MOSFET model, organic, power electronics, reliability, SSDM
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SSDM 2019: paper accepted
The following paper has been accepted as an oral presentation in International Conference on Solid State Devices and Materials (SSDM) 2019. Kunihiro Oshima, Michiaki Saito, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato, “Experimental study of bias stress degradation … Continue reading
Posted in Conference/Workshop
Tagged device model, JSAP, organic, reliability, SSDM
Comments Off on SSDM 2019: paper accepted