Tag Archives: reliability

DA symposium

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(日本語) Japanese Journal of Applied Physicsへの論文採録決定

Sorry, this entry is only available in 日本語.

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(日本語) SASIMI2019

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SSDM 2019: paper accepted

The following paper has been accepted as an oral presentation in International Conference on Solid State Devices and Materials (SSDM) 2019. Kunihiro Oshima, Michiaki Saito, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato, “Experimental study of bias stress degradation … Continue reading

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ICMTS2019

Two students, Tsukamoto and Saito, presented papers in the 32nd IEEE International Conference on Microelectronic Test Structure (ICMTS) 2019, at the International conference center in Kitakyushu, which was held during March 18-21, 2019. Hiroki Tsukamoto, Michihiro Shintani, and Takashi Sato, … Continue reading

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(日本語) 2018年 電子情報通信学会 ソサイエティ大会

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