Tag Archives: Journal

IEEE Trans. Semicond. Manufact.: paper accepted

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IEEE Sensors Jornal, paper accepted

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A paper accepted for publication in IEEE Transactions on Semiconductor Manufacturing

Hiroki Tsukamoto, Michihiro Shintani and Takashi Sato: “Statistical Extraction of Normally and Lognormally Distributed Model Parameters for Power MOSFETs,” IEEE Transactions on Semiconductor Manufacturing, (to appear). DOI: 10.1109/TSM.2020.2975300

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(日本語) Japanese Journal of Applied Physicsへの論文採録決定

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(日本語) Japanese Journal of Applied Physicsへの論文採録決定

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(日本語) IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciencesへの論文採録決定

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(日本語) 英文論文誌 IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciencesへの論文掲載

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(日本語) 英文論文誌Nonlinear Theory and Its Applications, IEICE (NOLTA)への論文掲載

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(日本語) Nonlinear Theory and Its Applications, IEICEへの論文採録決定

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(日本語) IEEE Transactions Circuits and Systems II: Express Briefsへの論文採録決定

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