Tag Archives: IEICE

(日本語) 英文論文誌Nonlinear Theory and Its Applications, IEICE (NOLTA)への論文掲載

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(日本語) IEICE VLD/CAS/SIP/MSS研究会

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(日本語) 第31回 回路とシステムワークショップ@北九州国際会議場

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A paper accepted for publication in Nonlinear Theory and Its Applications, IEICE

The following paper has been accepted for publication in Nonlinear Theory and Its Applications, IEICE. Rui Zhou, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato: “Modeling of Interelectrode Parasitic Elements of V-Groove SiC MOSFET,” Nonlinear Theory and Its Applications, IEICE, (to appear).

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A paper accepted for publication in IEICE journal

The following paper has been accepted for publication in IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. Satoshi Yamamori, Masayuki Hiromoto, and Takashi Sato: “Efficient Mini-Batch Training on Memristor Neural Network Integrating Gradient Calculation and Weight Update,” IEICE … Continue reading

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(日本語) 第31回 回路とシステムワークショップ 採択決定

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A paper accepted for publication in IEICE journal

The following paper has been accepted for publication in IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. Masayuki Hiromoto, Motoki Yoshinaga, and Takashi Sato: “MRO-PUF: Physically Unclonable Function with Enhanced Resistance against Machine Learning Attacks Utilizing Instantaneous Output … Continue reading

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Paper Published on IEICE Transactions on Information and Systems

The following paper has been published on IEICE Transactions on Information and Systems. An area-efficient FPGA-based annealing processor that is based on Ising model is proposed. The proposed processor eliminates random number generators (RNGs) and temperature schedulers, which are the … Continue reading

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(日本語) PRMU/MVE/CVIM研究会

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Paper Published on IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences

The following paper has been published on IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. As technology further scales semiconductor devices, aging-induced device degradation has become one of the major threats to device reliability. In addition, aging mechanisms … Continue reading

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