Tag Archives: IEEE

DAC2020

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IEEE Trans. Semicond. Manufact.: paper accepted

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IEEE Sensors Jornal, paper accepted

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A paper has been accepted for publication in IEEE Transactions on Information Forensics & Security

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A paper accepted for publication in IEEE Transactions on Semiconductor Manufacturing

Hiroki Tsukamoto, Michihiro Shintani and Takashi Sato: “Statistical Extraction of Normally and Lognormally Distributed Model Parameters for Power MOSFETs,” IEEE Transactions on Semiconductor Manufacturing, (to appear). DOI: 10.1109/TSM.2020.2975300

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DAC2020: paper accepted

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(日本語) ASPDAC2020

A master course student, Yuki Kume, made a presentation in ASPDAC2020 held at China National Convention Center, Beijing, China. Echo State Network (ESN), which is a kind of recurrent neural network (RNN), has recently attracted many attentions. The weights of … Continue reading

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BioCAS2019

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(日本語) BioCAS採択決定

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A paper accepted for presentation in ASPDAC2020

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