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- ▼2021 (5)
- ▼February (3)
- IEEE関西支部学生研究奨励賞 受賞IEEE Kansai section student paper award
- ISCAS2021採択決定ISCAS2021: paper acceptedISCAS2021: paper accepted
- IEEE CEDA All Japan Joint Chapter Academic Research Award受賞Oshima received the IEEE CEDA All Japan Joint Chapter Academic Research AwardOshima received the IEEE CEDA All Japan Joint Chapter Academic Research Award
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Tag Archives: IEEE
(日本語) IEEE関西支部学生研究奨励賞 受賞
对不起,此内容只适用于日本語。
Oshima received the IEEE CEDA All Japan Joint Chapter Academic Research Award
Posted in Award
Tagged academic research award, CEDA, IEEE
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IEEE Kansai Chapter MFSK Award
Posted in Award
Tagged device model, electron device society, IEEE, organic
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IEEE Trans. Semicond. Manufact.: paper accepted
对不起,此内容只适用于日本語。
Posted in Publication
Tagged device model, IEEE, Journal, organic
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IEEE Sensors Jornal, paper accepted
对不起,此内容只适用于日本語。
Posted in Publication
Tagged IEEE, Journal, puf, security
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A paper has been accepted for publication in IEEE Transactions on Information Forensics & Security
对不起,此内容只适用于English和日本語。
Posted in Publication
Tagged IEEE, security, TIFS
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A paper accepted for publication in IEEE Transactions on Semiconductor Manufacturing
Hiroki Tsukamoto, Michihiro Shintani and Takashi Sato: “Statistical Extraction of Normally and Lognormally Distributed Model Parameters for Power MOSFETs,” IEEE Transactions on Semiconductor Manufacturing, (to appear). DOI: 10.1109/TSM.2020.2975300
Posted in Publication
Tagged device model, IEEE, Journal, power electronics
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DAC2020: paper accepted
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Posted in Conference/Workshop
Tagged ACM, DAC, IEEE, novel computing
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(日本語) ASPDAC2020
A master course student, Yuki Kume, made a presentation in ASPDAC2020 held at China National Convention Center, Beijing, China. Echo State Network (ESN), which is a kind of recurrent neural network (RNN), has recently attracted many attentions. The weights of … Continue reading
Posted in Conference/Workshop
Tagged ACM, ASP-DAC, IEEE, novel computation
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