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Tag Archives: IEEE
IEEE Trans. Semicond. Manufact.: paper accepted
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Tagged device model, IEEE, Journal, organic
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IEEE Sensors Jornal, paper accepted
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A paper has been accepted for publication in IEEE Transactions on Information Forensics & Security
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A paper accepted for publication in IEEE Transactions on Semiconductor Manufacturing
Hiroki Tsukamoto, Michihiro Shintani and Takashi Sato: “Statistical Extraction of Normally and Lognormally Distributed Model Parameters for Power MOSFETs,” IEEE Transactions on Semiconductor Manufacturing, (to appear). DOI: 10.1109/TSM.2020.2975300
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DAC2020: paper accepted
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(日本語) ASPDAC2020
A master course student, Yuki Kume, made a presentation in ASPDAC2020 held at China National Convention Center, Beijing, China. Echo State Network (ESN), which is a kind of recurrent neural network (RNN), has recently attracted many attentions. The weights of … Continue reading
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(日本語) BioCAS採択決定
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A paper accepted for presentation in ASPDAC2020
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Tagged ACM, ASP-DAC, IEEE, novel computation
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