Tag Archives: IEEE

(日本語) IEEE関西支部学生研究奨励賞 受賞

Posted on 02/19/21 Friday by ts

对不起，此内容只适用于日本語。

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Oshima received the IEEE CEDA All Japan Joint Chapter Academic Research Award

Posted on 02/01/21 Monday by ts
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IEEE Kansai Chapter MFSK Award

Posted on 12/03/20 Thursday by ts
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DAC2020

Posted on 07/28/20 Tuesday by ts
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IEEE Trans. Semicond. Manufact.: paper accepted

Posted on 04/15/20 Wednesday by ts

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IEEE Sensors Jornal, paper accepted

Posted on 04/07/20 Tuesday by ts

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A paper has been accepted for publication in IEEE Transactions on Information Forensics & Security

Posted on 03/30/20 Monday by ts

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A paper accepted for publication in IEEE Transactions on Semiconductor Manufacturing

Posted on 02/26/20 Wednesday by ts

Hiroki Tsukamoto, Michihiro Shintani and Takashi Sato: “Statistical Extraction of Normally and Lognormally Distributed Model Parameters for Power MOSFETs,” IEEE Transactions on Semiconductor Manufacturing, (to appear). DOI: 10.1109/TSM.2020.2975300

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DAC2020: paper accepted

Posted on 02/13/20 Thursday by ts

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(日本語) ASPDAC2020

Posted on 01/22/20 Wednesday by ts

A master course student, Yuki Kume, made a presentation in ASPDAC2020 held at China National Convention Center, Beijing, China. Echo State Network (ESN), which is a kind of recurrent neural network (RNN), has recently attracted many attentions. The weights of … Continue reading →

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