Tag Archives: device model

SSDM 2019

Posted on Friday September 6th, 2019 by ts
Posted in Conference/Workshop | Tagged , , | Comments Off on SSDM 2019

A paper accepted for presentation in WiPDA2019

Posted on Monday September 2nd, 2019 by ts

Sorry, this entry is only available in 日本語.

Posted in Conference/Workshop | Tagged , , | Comments Off on A paper accepted for presentation in WiPDA2019

DA symposium 2019

Posted on Sunday September 1st, 2019 by ts
Posted in Conference/Workshop | Tagged , , , | Comments Off on DA symposium 2019

SSDM 2019: paper accepted

Posted on Thursday June 27th, 2019 by ts

The following paper has been accepted as an oral presentation in International Conference on Solid State Devices and Materials (SSDM) 2019. Kunihiro Oshima, Michiaki Saito, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato, “Experimental study of bias stress degradation … Continue reading →

Posted in Conference/Workshop | Tagged , , , , | Comments Off on SSDM 2019: paper accepted

ICMTS2019

Posted on Tuesday April 2nd, 2019 by ts

Two students, Tsukamoto and Saito, presented papers in the 32nd IEEE International Conference on Microelectronic Test Structure (ICMTS) 2019, at the International conference center in Kitakyushu, which was held during March 18-21, 2019. Hiroki Tsukamoto, Michihiro Shintani, and Takashi Sato, … Continue reading →

Posted in Conference/Workshop | Tagged , , , , , | Comments Off on ICMTS2019

(日本語) 英文論文誌Nonlinear Theory and Its Applications, IEICE (NOLTA)への論文掲載

Posted on Monday July 2nd, 2018 by ts

Sorry, this entry is only available in 日本語.

Posted in Publication | Tagged , , , | Comments Off on (日本語) 英文論文誌Nonlinear Theory and Its Applications, IEICE (NOLTA)への論文掲載

IPEC2018

Posted on Wednesday June 13th, 2018 by ts

Sorry, this entry is only available in 日本語.

Posted in Uncategorized | Tagged , | Comments Off on IPEC2018