Tag Archives: ACM

A paper presented at DAC2016

Posted on Wednesday June 15th, 2016 by ts

Dr. Awano presented a paper in Design Automation Conference (DAC) 2016 held in Austin, Tx. His talk is about the accelerated calculation of timing yield of logic circuits. By introducing the idea of Line sampling to the timing analysis, simulations … Continue reading →

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(日本語) VMC2015

Posted on Wednesday November 18th, 2015 by admin

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(日本語) ICCAD2014 採択決定

Posted on Friday June 6th, 2014 by hiromoto

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VMC2013

Posted on Friday November 29th, 2013 by ts

On Nov. 21, Mr. Awano presented his recent work on long term reliability of VLSI circuits at VMC2013 held in San Jose. Bias temperature instability (BTI) is considered to have significant impact on long term reliability of VLSI.  At the … Continue reading →

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DATE 2013

Posted on Monday March 25th, 2013 by admin

On March 20th, Mr. Imagawa and Mr. Rákossy presented their recent works at Design, Automation & Test in Europe (DATE) 2013, which was held in Grenoble, France. Zoltán Endre Rákossy, Masayuki Hiromoto, Hiroshi Tsutsui, Takashi Sato, Yukihiro Nakamura, and Hiroyuki … Continue reading →

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Paper accepted for GLSVLSI2013

Posted on Monday February 18th, 2013 by ts

The following paper is accepted for presentation at GLSVLSI2013, which will be held on May 2-4 in Paris, France. Takumi Morishita, Hiroshi Tsutsui, Hiroyuki Ochi and Takashi Sato, ”Fast and Memory-Efficient GPU Implementations of Krylov Subspace Methods for Efficient Power … Continue reading →

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ACM/IEEE ASPDAC 2013

Posted on Sunday January 27th, 2013 by ts

This gallery contains 4 photos.

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ASP-DAC 2013 papers accepted

Posted on Wednesday November 21st, 2012 by admin

The following two papers will appear in proceedings of ASP-DAC 2013. Michihiro Shintani and Takashi Sato, “An Adaptive Current-Threshold Determination for IDDQ Testing Based on Bayesian Process Parameter Estimation,” ACM/IEEE Asia South Pacific Design Automation Conference (ASP-DAC) (Pacifico Yokohama, Yokohama, Japan), … Continue reading →

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DATE2013 papers accepted

Posted on Monday November 19th, 2012 by admin

The following two papers are accepted for presentation at DATE2013. According to the acceptance notification, only 206 papers out of 829 reviewed submissions were selected for either “long” or “short” presentation at the conference, which means the acceptance ratio is … Continue reading →

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VMC2012

Posted on Monday November 12th, 2012 by ts

On November 8th, Prof. Sato presented the following work (poster presentation) at VMC2012 (IEEE/ACM Workshop on Variability Modeling and Characterization 2012), which was held in San Jose, CA. Michihiro Shintani and Takashi Sato, “Adaptive Current-Threshold Determination for Accurate IDDQ Testing,” … Continue reading →

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