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Tag Archives: ACM
A paper presented at DAC2017
Mr. Song Bian presented his paper in Design Automation Conference (DAC) 2017 held in Austin, Tx. Song’s presentation was on creating learning-based STA libraries for characterizing aging-induced device variations. Traditional approach to the accurate characterization of aging (specifically negative bias … Continue reading
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DATE 2017
Mr. Song Bian presented his paper at Design, Automation and Test in Europe (DATE) 2017 held in Lausanne, Switzerland. The acceptance rate of oral presentation is 24%. Song’s talk was on the realization of a secured content addressable memory (CAM) … Continue reading
Student paper accepted for presentation in DAC 2017
The following paper has been accepted for presentation in DAC 2017 (ACM/IEEE Design Automation Conference). Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato: “LSTA: Learning-Based Static Timing Analysis for High-Dimensional Correlated On-Chip Variations,” in Proc. of ACM/IEEE Design Automation … Continue reading
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ACM/IEEE ASPDAC 2017
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Tagged ACM, ASP-DAC, IEEE
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Paper accepted for presentation in ASP-DAC 2017
The following paper has been accepted for presentation in ASP-DAC 2017 (Asia and South Pacific Design Automation Conference). Acceptance rate 31%=111/358. Hiromitsu Awano, Masayuki Hiromoto, and Takashi Sato: “Efficient Circuit Failure Probability Calculation Along Product Lifetime Considering Device Aging,” 22nd … Continue reading
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A paper presented at DAC2016
Dr. Awano presented a paper in Design Automation Conference (DAC) 2016 held in Austin, Tx. His talk is about the accelerated calculation of timing yield of logic circuits. By introducing the idea of Line sampling to the timing analysis, simulations … Continue reading
(日本語) VMC2015
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(日本語) ICCAD2014 採択決定
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VMC2013
On Nov. 21, Mr. Awano presented his recent work on long term reliability of VLSI circuits at VMC2013 held in San Jose. Bias temperature instability (BTI) is considered to have significant impact on long term reliability of VLSI. At the … Continue reading
DATE 2013
On March 20th, Mr. Imagawa and Mr. Rákossy presented their recent works at Design, Automation & Test in Europe (DATE) 2013, which was held in Grenoble, France. Zoltán Endre Rákossy, Masayuki Hiromoto, Hiroshi Tsutsui, Takashi Sato, Yukihiro Nakamura, and Hiroyuki … Continue reading