A paper entitled “OCM-PUF: an organic current mirror PUF with enhanced resilience to device degradation”, has been accepted for poster presentation at the 2019 IEEE International Conference on Flexible & Printable Sensors & Systems, to be held in Glasgow, Scotland from July 7-10, 2019.
Photos taken after graduation ceremony for undergraduates. Congratulations!
Two students, Tsukamoto and Saito, presented papers in the 32nd IEEE International Conference on Microelectronic Test Structure (ICMTS) 2019, at the International conference center in Kitakyushu, which was held during March 18-21, 2019.
- Hiroki Tsukamoto, Michihiro Shintani, and Takashi Sato, “Study on statistical parameter extraction of power MOSFET model by principal component analysis,” in Proc. IEEE International Conference on Microelectronic Test Structures (ICMTS), pp.107-112, March 2019.
- Michiaki Saito, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato, “A compact model of I-V characteristic degradation for organic thin film transistors,” in Proc. IEEE International Conference on Microelectronic Test Structures (ICMTS), pp.194-199, March 2019.
In the annual meeting of IEEE Kansai Section held on February 22nd, 2019, Yuki Tanaka received the IEEE Kansai Section Student Paper Award for his following publication.
- Yuki Tanaka, Song Bian, Masayuki Hiromoto, and Takashi Sato:
“Coin Flipping PUF: A Novel PUF with Improved Resistance Against Machine Learning Attacks,” IEEE Transactions Circuits and Systems II: Express Briefs, Vol.65, No.5, pp.602-606, May 2018.
Posted in Award
Lab tour was held on 1pm-3pm Feb. 21, 2019. Please feel free to visit us at any time or send an e-mail for an appointment, if you missed the chance.