A paper accepted for publication in IEEE Transactions on Semiconductor Manufacturing

Posted on 02/26/20 Wednesday by ts
  • Hiroki Tsukamoto, Michihiro Shintani and Takashi Sato:
    “Statistical Extraction of Normally and Lognormally Distributed Model Parameters for Power MOSFETs,” IEEE Transactions on Semiconductor Manufacturing, (to appear).
    DOI: 10.1109/TSM.2020.2975300
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