IEEE Transactions on Very Large Scale Integration Systemsへの論文採録決定

以下の論文がIEEE Transactions on Very Large Scale Integration Systems (TVLSI)へ採録されました.

  • Hiromitsu Awano, Shumpei Morita, and Takashi Sato:
    “Scalable device array for statistical characterization of BTI-related parameters,”
    IEEE Transactions on Very Large Scale Integration (VLSI) Systems,
    DOI: 10.1109/TVLSI.2016.2638021
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