Mr. Bian presented his paper at Asian Test Symposium (ATS 2016) held in International Conference Center Hiroshima, Japan.
Song’s talk was on the mitigation of NBTI degradation in processors. Integrated circuits suffer from the so called aging effect, represented by the negative bias temperature instability (NBTI) phenomenon, where the circuit delay gradually (and significantly) degrades over years. This work tries to address the worst-case delay degradation by employing special logic gate, known as the internal control (INC) logic, controlled by the NOP instruction to mitigate NBTI-induced aging degradation in processors. In addition, to minimize the number of INC logic, genetic optimization is used to find the quasi-optimal solution to the problem. Through numerical experiment, it is demonstrated that
delay degradation is mitigated by as much as 45%, translating to a lifespan extension of around 6 times.
- Song Bian, Michihiro Shintani, Zheng Wang, Masayuki Hiromoto, Anupam Chattopadhyay, and Takashi Sato:
“Runtime NBTI Mitigation for Processor Lifespan Extension via Selective Node Control,” in Proc. of IEEE Asian Test Symposium (ATS), pp.234-239, Nov. 2016.