Papers accepted for presentation in VMC 2016

The following papers have been accepted for presentation in VMC2016 (IEEE/ACM Workshop on Variability Modeling and Characterization).

  • Michihiro Shintani, Kazuki Oishi, Rui Zhou, Masayuki Hiromoto, and Takashi Sato:
    “Unique Device Identification Framework for Power MOSFETs Using Inherent Device Variation,” in Proc. of IEEE/ACM Workshop on Variability Modeling and Characterization (VMC) (Austin, TX), Nov. 2016 (to appear).
  • Shumpei Morita, Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato:
    “Representative Path Approach for Time-Efficient NBTI Mitigation Logic Replacement,” in Proc. of IEEE/ACM Workshop on Variability Modeling and Characterization (VMC) (Austin, TX), Nov. 2016 (to appear).
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