During the International Conference on Computer-Aided Design (ICCAD) 2014 held in San Jose, California on November 2~6, 2014, Dr. Shintani made a presentation on his research (The presentation was on Nov. 4. Acceptance rate is 77/304=25%).
ICCAD is the leading conference in the field of CAD (Computer-aided design) for integrated circuits. This year marks the 33rd session convened for this time-honored international conference. During the conference, the state-of-art CAD researches were thoroughly presented and discussed, envisioning also in the fields of embedded IC for cars and IC security. This conference was hold annually in San Jose, the center of Silicon Valley. Around the site where the conference was held stand the head quarters of many high-tech companies including Apple Inc. It is one of the largest home for the IT business.
- Michihiro Shintani and Takashi Sato:
“Sensorless Estimation of Global Device-Parameters Based on Fmax Testing,” in Proc. of ACM/IEEE International Conference on Computer-Aided Design (ICCAD), pp.498-503, Nov. 2014.