次の論文がDATE2015（the 18th Design, Automation and Test in Europe）のlong presentationに採択されました．
- Hiromitsu Awano, Masayuki Hiromoto and Takashi Sato, “ECRIPSE: An Efficient Method for Calculating RTN-Induced Failure Probability of an SRAM Cell,” accepted for a long presentation, 2014. (Grenoble, France) (acceptance rate for a short or long presentation: 205/915 = 22.4%)