The IEEE 12th International Conference on Solid-State and Integrated Technology (ITSICT2014) was held in Guilin, Guangxi, China on October 27~31, 2014. Professor Sato made his invited talk on the long-term reliability of semiconductor circuits (The talk was on Oct. 28).
A significant number of presentations were delivered during the conference, reflecting the active nature of Chinese scholars in fields related to microdevices.
- Takashi Sato, Hiromitsu Awano, and Masayuki Hiromoto:
“A Scalable Device Array for Statistical Device-Aging Characterization (invited),” in Proc. of 2014 IEEE 12th International Conference on Solid-State and Integrated Circuit Technology (ICSICT-2014) (Guilin, China), pp.255-258, Oct. 2014.