IEEE Transactions on Device and Materials Reliabilityへの論文採録決定

IEEE Transactions on Device and Materials Reliabilityへの以下の論文の採録が決定しました.

  • Hiromitsu Awano, Masayuki Hiromoto and Takashi Sato, “BTIarray: A Time-overlapping Transistor Array for Efficient Statistical Characterization of Bias Temperature Instability,” IEEE Transactions on Device and Materials Reliability, (to appear).
カテゴリー: Publication タグ: , パーマリンク