IEEE Transactions on Device and Materials Reliabilityへの論文採録決定

以下の論文のIEEE Transactions on on Device and Materials Reliability への採録が決定しました。

Ketul Sutaria, Amar, Chris Kim, Takashi Sato, and Yu Cao, “Aging statistics based on trapping/detrapping: compact modeling and silicon validation,” to appear in IEEE Transactions on  Device and Materials Reliability.

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