以下两篇论文将发表在ASP-DAC 2013（采用率97/311=31.2%）
- Michihiro Shintani and Takashi Sato, “An Adaptive Current-Threshold Determination for IDDQ Testing Based on Bayesian Process Parameter Estimation,” ACM/IEEE Asia South Pacific Design Automation Conference (ASP-DAC) (Pacifico Yokohama, Yokohama, Japan), Jan. 2013 (to appear).
- Tetsuro Miyakawa, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato, “Realization of Frequency-Domain Circuit Analysis Through Random Walk,” ACM/IEEE Asia South Pacific Design Automation Conference (ASP-DAC) (Pacifico Yokohama, Yokohama, Japan), Jan. 2013 (to appear).